邹新波
副教授、研究员、博导
博士毕业院校: 香港科技大学
电话: 021-20685373
办公室: 信息学院3D-324
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研究方向: 第三代半导体功率器件,GaN基微波和毫米波器件,宽禁带半导体陷阱物性研究
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    Dr. Xinbo Zou received his B.Eng degree in Electronic Science and Technology from Beijing University of Posts and Telecommunications (BUPT) in 2007. He received his Ph.D from the Hong Kong University of Science and Technology (HKUST) in 2013 for developing high-performance green and yellow LEDs on Si substrates with nanotechnology. From 2014 to 2017, he was a Research Assistant Professor with the Department of Electronic and Computer Engineering and a Junior Fellow in the Institute for Advanced Study (IAS) of HKUST. His main research interests include characterization of III-N materials and devices, from thin-film to nano-scale devices. Dr. Zou has authored more than 40 scientific papers. In September, 2017, he joined the School of Information Science and Technology (SIST) of ShanghaiTech University as a tenure-track assistant professor.

  • 姓名:郭好文
    身份:RF Engineer
    年级:
    邮箱:
    研究方向:基于片上测试平台,构建半导体器件的射频测试解决方案
  • 姓名:顾怡恬
    身份:博士生
    年级:2020级博士生
    邮箱:
    研究方向:
  • 姓名:陈嘉祥
    身份:博士生
    年级:2021级博士生
    邮箱:
    研究方向:GaN功率二极管及其瞬态特性和电力电子器件
  • 姓名:张羽
    身份:博士生
    年级:2021级博士生
    邮箱:
    研究方向:
  • 姓名:宋文涵
    身份:硕士生
    年级:2020级硕士生
    邮箱:
    研究方向:GaN器件的工艺和测试等
  • 姓名:徐梨花
    身份:硕士生
    年级:2020级硕士生
    邮箱:
    研究方向:GaN功率器件的设计和测试分析
  • 姓名:杜春琳
    身份:硕士生
    年级:2020级硕士生
    邮箱:
    研究方向:
  • 姓名:屈浩岚
    身份:硕士生
    年级:2021级硕士生
    邮箱:
    研究方向:GaN功率器件
  • 姓名:周隽民
    身份:硕士生
    年级:2021级硕士生
    邮箱:
    研究方向:射频电子器件
  • 姓名:李珂
    身份:硕士生
    年级:2021级硕士生
    邮箱:
    研究方向:射频电子器件与功率器件的表征
  • 姓名:睢金
    身份:硕士生
    年级:2021级硕士生
    邮箱:
    研究方向:GaN功率器件的性能测试及可靠性分析
  • 姓名:杜海涛
    身份:硕士生
    年级:2022级硕士生
    邮箱:
    研究方向:机器学习与GaN功率器件的结合
  • 姓名:朱一泰
    身份:硕士生
    年级:2022级硕士生
    邮箱:
    研究方向:GaN HEMT器件的可靠性测试
  • 姓名:高涵
    身份:硕士生
    年级:2022级硕士生
    邮箱:
    研究方向:GaN HEMT工艺及测试

EE 244 Optical communication systems

EE 111 Fundamentals of electric circuits


入选2018年上海市浦江人才计划,上海市东方学者(青年)

入选香港科技大学高等研究院青年学人

主持香港General Research Fund项目一项

合作主持广州市科技计划项目产学研协同创新重大专项项目一项

合作主持广东省科技发展专项资金项目一项

累计发表电子器件相关文章逾40篇

IEEE EDL 金牌审稿人(2014, 2017,2018)

IWN 2016(Orlando , US)分会场主席


  • 1. 张玉良*, Zou XB(邹新波);, Zhang YL(张玉良);Zou XB(邹新波)#, Device Design Assessment of GaN Junction Barrier Schottky Diodes, INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS-2018, Nov 2018,
  • 2. 张羽*, Zou, Xinbo;, Zhang, Yu;Liu, Chao;Zhu, Min;Zhang, Yuliang;Zou, Xinbo#, A review on GaN-based two-terminal devices grown on Si substrates, JOURNAL OF ALLOYS AND COMPOUNDS, 15 Jul 2021, 869(15):159214
  • 3. 张玉良*, Lau, Kei May;Zou, Xinbo;, Zhang, Yuliang;Zhang, Xu;Zhu, Min;Chen, Jiaxiang;Tang, Chak Wah;Lau, Kei May;Zou, Xinbo#, Forward Conduction Instability of Quasi-Vertical GaN p-i-n Diodes on Si Substrates, IEEE TRANSACTIONS ON ELECTRON DEVICES, Oct 2020, 67(10):3992-3998
  • 4. 顾怡恬*, Wang,Maojun;Zou,Xinbo;, Gu,Yitian;Wang,Yangqian;Chen,Jiaxiang;Chen,Baile;Wang,Maojun;Zou,Xinbo#, Temperature-Dependent Dynamic Degradation of Carbon-Doped GaN HEMTs, IEEE TRANSACTIONS ON ELECTRON DEVICES, Jul 2021,
  • 5. 陈嘉祥*, Chen,Jiaxiang;Zou,Xinbo;, Chen,Jiaxiang;Luo,Haoxun;Qu,HaoLan;Zhu,Min;Guo,Haowen;Chen,Baile;Lv,Yuanjie;Lu,Xing;Zou,Xinbo#, Single-trap emission kinetics of vertical β-Ga2O3 Schottky diodes by deep-level transient spectroscopy, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, May 2021, 36(5):055015
  • 6. 张玉良*, Zou, Xinbo;, Zhang, Yuliang;Lu, Xing;Zou, Xinbo#, Device Design Assessment of GaN Merged P-i-N Schottky Diodes, ELECTRONICS, Dec 2019, 8(12)
  • 7. 陈嘉祥*, Zou, Xinbo;, Chen, Jiaxiang;Zhu, Min;Lu, Xing;Zou, Xinbo#, Electrical characterization of GaN Schottky barrier diode at cryogenic temperatures, APPLIED PHYSICS LETTERS, 10 Feb 2020, 116(6)
  • 8. 郭好文*, Guo,Haowen;Zou,Xinbo;, Guo,Haowen;Zhou,Junmin;Wang,Maojun;Zou,Xinbo#, Output Phase and Amplitude Analysis of GaN-based HEMT at Cryogenic Temperatures, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, Nov 2021,
  • 9. 邹新波*, Zou, Xinbo;Lau, Kei May;, Zou, Xinbo;Zhang, Xu;Zhang, Yu;Lyu, Qifeng;Tang, Chak Wah;Lau, Kei May#, GaN Single Nanowire p-i-n Diode for High-Temperature Operations, ACS APPLIED ELECTRONIC MATERIALS, 24 Mar 2020, 2(3):719-724
  • 10. Zhang, Xu*, Lau, Kei May;, Zhang, Xu;Li, Peian;Zou, Xinbo;Jiang, Junmin;Yuen, Shing Hin;Tang, Chak Wah;Lau, Kei May#, Active Matrix Monolithic LED Micro-Display Using GaN-on-Si Epilayers, IEEE PHOTONICS TECHNOLOGY LETTERS, Jun 2019, 31(11):865-868
  • 11. 张羽*, Jiang, Huaxing;Lau, Kei May;Zou, Xinbo;, Zhang, Yu;Xu, Lihua;Gu, Yitian;Guo, Haowen;Jiang, Huaxing;Lau, Kei May;Zou, Xinbo#, Dynamic Characteristics of GaN MISHEMT with 5 nm in-situ SiNx Dielectric Layer, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2022, 10:1-1
  • 12. 周隽民*, Zou, Xinbo;, Zhou, Junmin;Guo, Haowen;Gu, Yitian;Zou, Xinbo#, Demonstration and modeling of frequency tripler based on GaN Schottky diode pair, MICROELECTRONICS JOURNAL, Jul 2022, 125
  • 13. 宋文涵*, Zou, Xinbo;, Song, Wenhan;Guo, Haowen;Gu, Yitian;Zhou, Junmin;Sui, Jin;Chen, Baile;Huang, Wei;Zou, Xinbo#, Power Compression and Phase Analysis of GaN HEMT for Microwave Receiver Protection, ELECTRONICS, Jul 2022, 11(13)
  • 14. 顾怡恬*, Huang, Wei;Zou, Xinbo;, Gu, Yitian;Huang, Wei;Zhang, Yu;Sui, Jin;Wang, Yangqian;Guo, Haowen;Zhou, Jianjun;Chen, Baile;Zou, Xinbo#, Temperature-Dependent Dynamic Performance of p-GaN Gate HEMT on Si, IEEE TRANSACTIONS ON ELECTRON DEVICES, Jun 2022,
  • 15. 陈嘉祥*, Zou XB(邹新波);, Jiaxiang Chen;Wei Huang;Haolan Qu;Yu Zhang;Jianjun Zhou;Baile Chen;Zou XB(邹新波)#, Study of Minority Carrier Traps in p-GaN Gate HEMT by Optical Deep Level Transient Spectroscopy, APPLIED PHYSICS LETTERS, 23 May 2022, 120(21):212105
  • 16. 陈嘉祥*, Lau, Kei May;Zou, Xinbo;, Chen, Jiaxiang;Qu, Haolan;Qi, Longheng;Liu, Yaying;Zhang, Xu;Lau, Kei May;Zou, Xinbo#, Trap Characterization of InGaN/GaN Blue Light Emitting Diode Grown on Si Substrate, ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE, ACP, 2021, 2021-October
  • 17. 屈昊岚*, Xinbo Zou;, Haolan Qu;Jiaxiang Chen;Yu Zhang;Jin Sui;Yitian Gu;Yuxin Deng;Danni Su;Ruohan Zhang;Xing Lu;Xinbo Zou#, Emission and Capture Characteristics of Electron Trap (Eemi = 0.8eV) in Si-doped β-Ga2O3 Epilayer, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, Jan 2023, 38(1):015001