上海科技大学 | English | 地图
首页> 新闻信息> 活动
A File System Bypassing Volatile Main Memory: Towards A Single-Level Persistent Store
Date:2018/6/4     Browse:144

Speaker:     Prof. Tao Xie. SDSU

Time:          10:00—11:00, June 4 

Location:    Room 1A-200, SIST Building

Host:          Prof. Shu Yin

Abstract:

Existing persistent memory (PM) based file systems rely on a DRAM and PM hybrid store. Although a hybrid store does boost system performance while avoiding some current PM limitations like limited endurance, we envision that with more advances PM technologies could provide applications with a single-level persistent store in the

not-so-distant future. As a first step to explore this direction, in this paper we design, implement, and evaluate a new persistent memory file system called SPFS (Single-level Persistent File System), which completely bypasses conventional DRAM-based volatile main memory.

Unlike all existing PM-based file systems, SPFS never leverages DRAM to manage its metadata. Thus, redundant copies of metadata in volatile main memory and data movements between the two memories can be totally eliminated. The goal of this paper is to explore how to manage files and their metadata with guaranteed data consistency on PM without the support of DRAM, which makes a first step towards the ultimate success of a single-level persistent store. Experimental results demonstrate that SPFS outperforms traditional DRAM-based in-memory file systems ramfs and tmpfs in most cases. Besides, its performance is only moderately worse than that of NOVA, a state-of-the-art PM-based file system.

Bio: 

Tao Xie is currently a professor in the Department of Computer Science at the San Diego State University. He is the director of the Computer Architecture and System Laboratory at SDSU (https://casl.sdsu.edu/). His research interests include storage systems, high performance computing, cluster and Grid computing, parallel and distributed systems. He received the NSF CAREER Award in 2009 and IPDPS Best Paper Award in 2013. He is a member of the IEEE and the ACM.

SIST-Seminar 18045